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Electron backscatter diffraction in materials science / Schwartz, Adam J.
Productor: Estados Unidos de América: Springer, 2009Descripción: 120 páginas ; 21 cmTipo de contenido:- texto
- no mediado
- volumen
- 9780387881355
- 620.11 S3991e 2009
Contenidos:
1. Present state of electron backscatter diffraction and prospective developments.-- 2. Dynamical simulation of electron backscatter diffraction patterns.-- 3. Representations of texture.-- 4. Energy filtering in EBSD.-- 5. Spherical kikuchi maps and other rarities.-- 6. Application of electron backdcattte diffraction to phase identification.-- 7. Phase identification through symmetry determination in EBSD patterns.-- 8. Three-Dimensional orientation mapping in a Fib-Sem.
| Tipo de ítem | Biblioteca actual | Colección | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems |
|---|---|---|---|---|---|---|---|---|
Libro
|
Sede Ambato Sala general | Col General | 620.11 S3991e 2009 (Navegar estantería(Abre debajo)) | Ej.1 | Disponible | AMB013465 |
Total de reservas: 0
Incluye bibliografía
1. Present state of electron backscatter diffraction and prospective developments.-- 2. Dynamical simulation of electron backscatter diffraction patterns.-- 3. Representations of texture.-- 4. Energy filtering in EBSD.-- 5. Spherical kikuchi maps and other rarities.-- 6. Application of electron backdcattte diffraction to phase identification.-- 7. Phase identification through symmetry determination in EBSD patterns.-- 8. Three-Dimensional orientation mapping in a Fib-Sem.
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