Materials characterization techniques / Zhang, Sam - 389 páginas : ilustraciones ; 22 cm.

Incluye bibliografía

1. Introduction. --2. Contact angle in surface analysis. --3. X-ray photoelectron spectroscopy and auger electron spectroscopy. --4. Scanning tunneling microscopy and atomic force microscopy. --5. X-ray diffraction. --6. Transmission electron microscopy. --7. Scanning electron miscrocopy. --8. Chromatographic methods. --9. Infrared spectroscopy and UV/Vis spectroscopy. --10. Macro and micro thermal analyses. --11. Laser confocal flourescence microscopy.

ISBN: 9781420042948

Subjects--Topical Terms:
MATERIALS. COMBINATIONS OF MATERIALS. TECHNIQUES.

Dewey Class. No.: 620.11 / Z632m