000 01064nam a2200217Ia 4500
001 15895
008 150612s2013 xxk 000 0 eng d
020 _a9783527334636
082 0 4 _a620.11
_bL5661m 2013
100 _qLeng, Yang
245 1 0 _aMaterials characterization : introduction to microscopic and spectroscopic methods / Leng, Yang
264 0 _a[sin lugar] :
_bWeinheim, Germany, Wiley-vch ,
_c2013
300 _a598 páginas ;
_c24 cm.
336 _atxt
337 _an
338 _anc
504 _aIncluye bibliografĂ­a
505 0 _a1. Light microscopy.-- 2. Ray diffraction mothods.-- 3. Transmission electron microscopy.-- 4. Scanning electron microscopy.-- 5. Scanning probe microscopy.-- 6. X-Ray spectroscopy for elemental analysis.-- 7. Electron spectroscopy for surface analysis.-- 8. secondary lon mass epectrometry for suface analysis.-- 9. Vibrational spectrscopy for molecular analysis.-- 10. thermal analysis.
650 1 4 _aMATERIALS. COMBINATIONS OF MATERIALS. TECHNIQUES.
942 0 0 _00
_cBK
999 _c220257
_d220257